Theory of Reliability and Radiation Tolerance Funded by NASA-JSC ('91-'95)
The purpose of this project was to address the issue of reliability and fault-tolerance of large-scale electronic systems operating under hazardous conditions, in particular under exposure to space radiation. The goal of the project was to develop a mathematical approach to the problem mentioned, wherein the relevant quantities such as the reliability, mean time to failure, etc. can be computed in terms of appropriate parameters describing the various possible failure rates. The ultimate goal was to develop a comprehensive computer simulation program for simulating a complex system and to compute several of the quantities relevant to the operational behavior of a system. The first goal of developing the theoretical framework has been accomplished. The enclosed brief presentation summarizes the formalism as well as some of the results obtained. A simulation program - Circuit Simulation Program In the presence of Fatal Faults (CSPIFF) - has been developed under latter grants from NASA-JSC. This framework developed in this project, though motivated by electronic systems, is equally applicable to a large variety of problems, in particular reliability of large mechanical structures. Several conference publications have appeared as a result of this grant. This formalism and the CSPIFF have the potential to form a basis for commercialization and technology transfer.
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